BIM METHODOLOGY AND SYSTEM FOR QUANTITATIVE MEASUREMENT OF BIM DATA COMPOSITION AND CONSTRUCTION

The present invention relates to a methodology and a system for quantitative measurement of BIM data composition and construction. The methodology includes the steps of: inputting BIM data creation plan information; inputting evaluation criteria information of the BIM data; constructing BIM data bas...

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Bibliographische Detailangaben
Hauptverfasser:	KIM YI JE, CHIN SANG YOON
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	CALCULATING COMPUTING COUNTING DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES ELECTRIC DIGITAL DATA PROCESSING PHYSICS SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:	The present invention relates to a methodology and a system for quantitative measurement of BIM data composition and construction. The methodology includes the steps of: inputting BIM data creation plan information; inputting evaluation criteria information of the BIM data; constructing BIM data based on creation plan information; and evaluating the BIM data based on the evaluation criteria information. Therefore, it is possible to quantitatively evaluate to what extent requirements for BIM object information are met. 본 발명은 BIM데이터 구성 및 작성에 대한 정량적 측정방법 및 시스템에 관한 것이다. 본 발명은 BIM데이터의 작성계획정보가 입력되는 단계; BIM데이터의 평가기준정보가 입력되는 단계; 작성계획정보에 기초하여 BIM데이터를 작성하는 단계; 및 평가기준정보에 기초하여 BIM데이터를 평가하는 단계를 포함할 수 있다.