AUTOMATIC QUALITY INSPECTION DEVICE AND METHOD OF HOLE IMAGE BASED ON ARTIFICIAL INTELLIGENCE

The present invention relates to a quality inspection technology for hole images, and more specifically to a quality inspection device and a method thereof that can automatically inspect the quality of hole images included in a semiconductor printed board performed in a laser processing process. The...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	SHIN IN CHUL, AHN SOO HO, KIM HA YUL, KIM JIN YOUB
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	The present invention relates to a quality inspection technology for hole images, and more specifically to a quality inspection device and a method thereof that can automatically inspect the quality of hole images included in a semiconductor printed board performed in a laser processing process. The present invention is the artificial intelligence-based automatic quality inspection device for hole images, comprising: an input unit for inputting collected images; a pre-processing unit that pre-processes the collected images; and a defect determination unit that performs defect determination on the pre-processed hole image using a pre-trained neural network. 본 발명은 홀 이미지의 품질 검사 기술에 관한 것으로, 더욱 상세하게는 레이저 가공 공정에서 수행되는 반도체 인쇄기판에 포함된 홀 이미지의 품질을 자동으로 검사하는 품질 검사 장치 및 방법에 관한 것이다.