TEST SOCKET

The present invention is to provide a test socket that has a minimum length suitable for electrical testing of a semiconductor device, and has a stable stroke and excellent electrical characteristics. The test socket according to an embodiment of the present invention includes a configuration in whi...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	KOO CHEOL HOE, SHIM YUN HEE, KIM YONG KI, KIM WON WOO, SONG BYUNG CHANG, OH TAE SEUNG, KIM DONG IL, HAM JU WON, HEO JIN HYANG
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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Beschreibung
Zusammenfassung:	The present invention is to provide a test socket that has a minimum length suitable for electrical testing of a semiconductor device, and has a stable stroke and excellent electrical characteristics. The test socket according to an embodiment of the present invention includes a configuration in which at least one layer of spiral plates is stacked through a central or outer part. 본 발명은 반도체 소자의 전기적 테스트에 적합한 최소 길이를 가지면서도 안정된 스트로크 및 우수한 전기적 특성을 갖는 테스트 소켓을 제공하고자 한다. 본 발명의 일 실시예에 따른 테스트 소켓은 적어도 한 층 이상의 나선형 플레이트가 중심부 또는 외측부를 통해 적층된 구성을 포함한다.