DEFECT INSPECTION APPARATUS AND METHOD OF QUANTUM DOT DISPLAY

The present invention relates to a defect inspection device and a method for quantum dot displays, comprising: a camera that captures a color image of a light emitting layer including quantum layers containing quantum dots and a bank isolating the quantum layers; a coaxial light lighting unit that p...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: PARK JONG CHEOL, JEE GEUNCHANG, AHN KANG SIK, KIM JIN, PARK ILL WON, CHO SOUNGHUN, KIM JIN WOO, KIM MYUNGSIK, CHAE SEUNGSEOK, LEE JOONG KEUN
Format: Patent
Sprache:eng ; kor
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Beschreibung
Zusammenfassung:The present invention relates to a defect inspection device and a method for quantum dot displays, comprising: a camera that captures a color image of a light emitting layer including quantum layers containing quantum dots and a bank isolating the quantum layers; a coaxial light lighting unit that provides lighting to the light emitting layer in the same direction as the capturing direction of the camera; a side light lighting unit that provides blue light lighting to the light emitting layer in a direction inclined from the capturing direction of the camera; and a lighting control unit that controls the coaxial light lighting unit and the side light lighting unit, and controls the coaxial light lighting unit and the side light lighting unit to alternately provide lighting, thereby capable of accurately recognizing the color of the quantum layer. 본 발명은 양자점 디스플레이의 결함 검사 장치 및 방법에 관한 것으로, 양자점을 포함하는 양자층들과, 양자층들을 격리하는 뱅크를 포함하는 발광층의 컬러 이미지를 촬상하는 카메라와, 상기 발광층에 상기 카메라의 촬영 방향과 동일한 방향으로 조명을 제공하는 동축광 조명부와, 상기 발광층에 상기 카메라의 촬영 방향과는 경사진 방향으로 청색광 조명을 제공하는 측면광 조명부와, 상기 동축광 조명부와 상기 측면광 조명부를 제어하되, 상기 동축광 조명부와 상기 측면광 조명부가 순차 교번하여 조명을 제공하도록 제어하는 조명제어부를 포함한다.