APPARATUS AND METHOD FOR DETECTING DEFECTS OF GLOSSY SURFACES OF OBJECTS

The present invention proposes a surface defect detection device and a method thereof. The surface defect detection method performed by the surface defect detection device comprises the steps of: acquiring a photographed image of an object to be inspected; and detecting a defect using the acquired p...

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Bibliographische Detailangaben
Hauptverfasser:	KIM EUI SEOK, KIM TAE WOONG, YOON KIWOOK, SONG JEONGMIN
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	The present invention proposes a surface defect detection device and a method thereof. The surface defect detection method performed by the surface defect detection device comprises the steps of: acquiring a photographed image of an object to be inspected; and detecting a defect using the acquired photographed image, wherein the step of acquiring the photographed image includes the steps of: irradiating pattern light having a stripe pattern at regular intervals on a surface of the object to be inspected; and acquiring the photographed image by photographing the reflected light reflected from the surface of the object to be inspected. Embodiments disclosed in the present specification are intended to propose the device and method for detecting surface defects of a product having a glossy surface. 표면 결함 검출 장치 및 방법을 제시하며, 표면 결함 검출 장치가 수행하는 표면 결함 검출 방법은, 검사 대상의 촬영 이미지를 획득하는 단계; 획득된 촬영 이미지를 이용하여 결함을 검출하는 단계를 포함하고, 촬영 이미지를 획득하는 단계는, 검사 대상의 표면에 일정 간격의 스트라이프 패턴을 갖는 패턴광을 조사하는 단계; 검사 대상의 표면에서 반사되는 반사광을 촬영하여 촬영 이미지를 획득하는 단계를 포함한다.