METHOD AND ELECTRONIC DEVICE FOR IDENTIFYING DEFECTS IN SEMICONDUCTOR WAFERS

The present invention relates to a method and electronic device for identifying a defect in a semiconductor wafer. The method includes: receiving, by the electronic device, a plurality of semiconductor wafer images of different sizes and/or quality; determining, by the electronic device, one operati...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	SHASHISHEKARA PARAMPALLI ADIGA, PRASHANT PANDURANG SHINDE, PRIYADARSHINI PANEMANGALORE PAI
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	BASIC ELECTRIC ELEMENTS CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS SEMICONDUCTOR DEVICES
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