FILM INSPECTION APPARATUS FILM INSPECTION METHOD AND PROGRAM

The present invention does not require manual monitoring, and detects defects generated in a film easily. The present invention relates to a film inspection device for optically inspecting defects occurring in films in an overlapping state. The film inspection device comprises a first step of radiat...

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Bibliographische Detailangaben
Hauptverfasser:	HATAZAWA SHOTA, KAWAMURA YOSUKE, SAGAWA SHOGO
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	The present invention does not require manual monitoring, and detects defects generated in a film easily. The present invention relates to a film inspection device for optically inspecting defects occurring in films in an overlapping state. The film inspection device comprises a first step of radiating light on an inspection area of a film by a light source, a second step of detecting diffusion light among reflected light in the inspection area by photographing the inspection area of the film by a camera (optical sensor), and a fifth step of detecting defects by implementing data processing with respect to an output signal of the camera by a control unit. (과제) 사람손에 의한 감시를 필요로 하지 않고, 필름에 발생한 결함의 검출을 용이하게 실시한다. (해결 수단) 중첩된 상태의 필름에 발생한 결함을 광학적으로 검사하는 필름 검사 장치에 있어서, 광원에 의해, 필름의 검사 영역에 광을 조사하고 (스텝 S1), 카메라 (광학 센서) 에 의해, 필름의 검사 영역을 촬영하여 검사 영역에 있어서 반사된 광 중 확산광을 검출하고 (스텝 S2), 제어부에 의해, 카메라의 출력 신호에 대하여 데이터 처리를 실시함으로써, 결함을 검출한다 (스텝 S5).