Source supplier for supercritical fluid substrate treating apparatus having the same and method of treating substrates in the substrate treating apparatus
Disclosed are an electrostatic chuck assembly and a plasma processing apparatus including the same. The electrostatic chuck assembly includes a dielectric plate having an adsorption electrode for supporting a substrate and generating an electrostatic force for securing the substrate, a conductive ba...
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Zusammenfassung: | Disclosed are an electrostatic chuck assembly and a plasma processing apparatus including the same. The electrostatic chuck assembly includes a dielectric plate having an adsorption electrode for supporting a substrate and generating an electrostatic force for securing the substrate, a conductive base plate coupled to the dielectric plate so as to support the dielectric plate and having high-frequency power applied thereto, and an insulating plate composed of an insulating material, coupled to the base plate so as to support the base plate, and having a low dielectric layer with a dielectric constant less than the dielectric constant of the insulating material. A high-frequency power rod is configured to have a rod size in the range of 0.4 to 0.6, and a shielding ring is composed of a material with a dielectric constant of 5 or less. Accordingly, plasma uniformity can be improved by increasing a current supplied to the substrate.
정전척 어셈블리 및 이를 구비하는 플라즈마 처리장치를 개시한다. 정전척 어셈블리는 기판을 지지하고 기판을 고정하는 정전기력을 생성하는 흡착전극을 구비하는 유전판, 유전판을 지지하도록 상기 유전판과 결합되고 고주파 전력이 인가되는 도전형 기저판 및 절연물질로 구성되고 기저판을 지지하도록 기저판과 결합되며 절연물질의 유전상수보다 작은 유전상수를 갖는 저유전층을 구비하는 절연판을 포함한다. 로드 사이즈를 0.4 내지 0.6의 범위를 갖도록 고주파 전력로드를 구성하고 차폐링을 유전상수 5이하의 물질로 구성한다. 이에 따라, 기판으로 공급되는 전류를 증가시켜 플라즈마 균일도를 높일 수 있다. |
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