Evaporation Coating thickness Uniformity Control System
An objective of the present invention is to maintain uniformity of a thin film when a long-term process in a mass production line causes a change in material flux by providing a remote-controlled material flux calibration plate that can calibrate material flux without stopping line operation, while...
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Format: | Patent |
Sprache: | eng ; kor |
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Zusammenfassung: | An objective of the present invention is to maintain uniformity of a thin film when a long-term process in a mass production line causes a change in material flux by providing a remote-controlled material flux calibration plate that can calibrate material flux without stopping line operation, while performing a continuous process for a long time. According to the above objective, the present invention constitutes a driving unit capable of remotely driving forward and backward on a correction plate disposed above an evaporation source nozzle.
본 발명의 목적은 양산 라인에서 장시간 공정이 진행되어 물질 플럭스에 변화가 생길 경우, 라인 운영을 중단하지 않고 물질 플럭스를 보정 할 수 있는 원격 제어형 물질 플럭스 보정판을 제공하여, 장시간 연속공정을 진행하면서도 박막 균일성을 유지하도록 하는 것이다. 상기 목적에 따라 본 발명은 증착원 노즐 상부에 배치되는 보정판에 원격으로 전후진 구동될 수 있는 구동부를 구성한다. |
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