2 2 Overhang inspection device for secondary battery and manufacturing system having the same

An overhang inspection device for a secondary battery is disclosed. The overhang inspection device for a secondary battery according to the present invention includes: a jig unit for a plurality of stacks for clamping electrode stacks in which positive electrodes and negative electrodes are alternat...

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Bibliographische Detailangaben
Hauptverfasser:	KONG BYUNG YUN, KIM DOO HWAN, PARK GI TAE, KIM. JANG MI
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSIONOF CHEMICAL INTO ELECTRICAL ENERGY TESTING
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Beschreibung
Zusammenfassung:	An overhang inspection device for a secondary battery is disclosed. The overhang inspection device for a secondary battery according to the present invention includes: a jig unit for a plurality of stacks for clamping electrode stacks in which positive electrodes and negative electrodes are alternately crossed with a separator therebetween; an imaging unit for inspection that captures an image of the electrode stacks clamped on the jig unit for stacks; and a plurality of position variable units for stacks that are connected to each jig unit for stacks and relatively move each electrode stack with respect to the imaging unit for inspection. 2차 전지용 오버행 검사장치가 개시된다. 본 발명에 따른 2차 전지용 오버행 검사장치는, 음극과 양극이 분리막을 사이에 두고 교번적으로 교차되어 마련된 전극 적층체를 클램핑하는 복수의 적층체용 지그유닛과, 적층체용 지그유닛에 클램핑된 전극 적층체를 촬상하는 검사용 촬상유닛과, 적층체용 지그유닛 각각에 연결되며 각각의 전극 적층체를 검사용 촬상유닛에 대해 상대이동 시키는 복수의 적층체용 위치 가변유닛을 포함한다.