METHOD AND APPARATUS FOR MEASURING ABSOLUTE VALUE OF MAGNETIZATION IN PERPENDICULAR THIN FILM

According to an embodiment of the present invention, a method for measuring the magnitude of magnetization of a perpendicular magnetic thin film includes a magnetic domain width reduction step of reducing a period of a stripe pattern by applying a magnetic field in a horizontal direction to the perp...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	MOON KYOUNG WOONG, HWANG CHAN YONG, MIN BYOUNG CHUL, JO YOUNGHUN
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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