METHOD AND APPARATUS FOR MEASURING ABSOLUTE VALUE OF MAGNETIZATION IN PERPENDICULAR THIN FILM

According to an embodiment of the present invention, a method for measuring the magnitude of magnetization of a perpendicular magnetic thin film includes a magnetic domain width reduction step of reducing a period of a stripe pattern by applying a magnetic field in a horizontal direction to the perp...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	MOON KYOUNG WOONG, HWANG CHAN YONG, MIN BYOUNG CHUL, JO YOUNGHUN
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	According to an embodiment of the present invention, a method for measuring the magnitude of magnetization of a perpendicular magnetic thin film includes a magnetic domain width reduction step of reducing a period of a stripe pattern by applying a magnetic field in a horizontal direction to the perpendicular magnetic thin film on which the stripe pattern is formed. Accordingly, the present invention can measure the magnitude of magnetization of the perpendicular magnetic thin film even when an imaging area is narrower than the period of the stripe pattern. 본 발명의 실시예에 따른 수직자성박막의 자화의 크기를 측정하는 방법은, 스트라이프 패턴이 형성된 수직자성박막에 수평방향의 자기장을 인가하여 스트라이프 패턴의 주기를 감소시키는 자구 폭 감소 단계를 포함한다. 이에 따라, 본 발명은 스트라이프 패턴의 주기에 비해 이미징 영역이 좁은 경우에도 수직자성박막의 자화의 크기를 측정할 수 있다.