Defect detection method and apparatus
A defect identification method and an apparatus thereof are disclosed. The defect identification apparatus generates a 3D model including 3D coordinate values of an object based on a plurality of images taken of the object from various angles, generates a filler model including 3D coordinate values...
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Format: | Patent |
Sprache: | eng ; kor |
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Zusammenfassung: | A defect identification method and an apparatus thereof are disclosed. The defect identification apparatus generates a 3D model including 3D coordinate values of an object based on a plurality of images taken of the object from various angles, generates a filler model including 3D coordinate values of the object based on a plurality of low-resolution images after generating the plurality of low-resolution images in which the resolution of the plurality of images is reduced, removes the surface of the 3D model based on the surface of the filler model, and presents a remaining defective area remaining after removing the surface of the 3D model so as to identify defects. An objective of the present invention is to provide the method and apparatus for automatically detecting defects on the surface of an object using image photography.
결함 파악 방법 및 그 장치가 개시된다. 결함파악장치는 객체를 다양한 각도에서 촬영한 복수의 영상을 기초로 상기 객체의 3차원 좌표값을 포함하는 3차원 모델을 생성하고, 복수의 영상의 해상도를 낮춘 복수의 저해상도 영상을 생성한 후 복수의 저해상도 영상을 기초로 객체의 3차원 좌표값을 포함하는 필러 모델을 생성하고, 필러 모델의 표면을 기준으로 3차원 모델의 표면을 제거하고, 결함 여부를 파악할 수 있도록 3차원 모델의 표면을 제거하고 남은 결함영역을 제시한다. |
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