Wafer Temperature Gradient Control to Suppress Slip Formation in High-Temperature Epitaxial Film Growth

A method of operating a reactor system to provide wafer temperature gradient control is provided. The method includes a step of operating a center temperature sensor, an intermediate temperature sensor, and an edge temperature sensor to sense a temperature of a center region of a wafer on a suscepto...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: M'SAAD HI, HUANG SHUJIN, GOODMAN MATTHEW, SU JUNWEI, DEMOS ALEXANDROS, LIM DAW GEN, LIN XING
Format: Patent
Sprache:eng ; kor
Schlagworte:
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