WAVEFRONT MEASURING DEVICEAND METHOD USING THE SAME
The present invention relates to a device for measuring a wavefront and a measuring method using the same. The device comprises: a light providing unit including a light source; a light splitter that reflects light from the light providing unit to a specimen and transmits the reflected light; a geom...
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| creator | JEONG HYO BIN JOO KI NAM PARK HYO MI |
| description | The present invention relates to a device for measuring a wavefront and a measuring method using the same. The device comprises: a light providing unit including a light source; a light splitter that reflects light from the light providing unit to a specimen and transmits the reflected light; a geometric phase lens module which separates the light transmitted through the light splitter into first light and second light having different sizes and wavefronts; and an optical detecting unit for obtaining four phase-shifted interference fringes from the first light and the second light. Therefore, the present invention can measure a wavefront of light propagating in a space.
본 발명의 일 실시 예에 따른 빛의 파면을 측정하기 위한 장치 및 이를 이용한 측정 방법 따르면 기하 위상 렌즈 기반의 간섭계와 편광 카메라를 이용하여 빛이 공간상에 전파해 나가는 형태인 파면을 측정할 수 있게 된다. |
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본 발명의 일 실시 예에 따른 빛의 파면을 측정하기 위한 장치 및 이를 이용한 측정 방법 따르면 기하 위상 렌즈 기반의 간섭계와 편광 카메라를 이용하여 빛이 공간상에 전파해 나가는 형태인 파면을 측정할 수 있게 된다.</description><language>eng ; kor</language><subject>COLORIMETRY ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; PHYSICS ; RADIATION PYROMETRY ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220701&DB=EPODOC&CC=KR&NR=20220092248A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76516</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220701&DB=EPODOC&CC=KR&NR=20220092248A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>JEONG HYO BIN</creatorcontrib><creatorcontrib>JOO KI NAM</creatorcontrib><creatorcontrib>PARK HYO MI</creatorcontrib><title>WAVEFRONT MEASURING DEVICEAND METHOD USING THE SAME</title><description>The present invention relates to a device for measuring a wavefront and a measuring method using the same. The device comprises: a light providing unit including a light source; a light splitter that reflects light from the light providing unit to a specimen and transmits the reflected light; a geometric phase lens module which separates the light transmitted through the light splitter into first light and second light having different sizes and wavefronts; and an optical detecting unit for obtaining four phase-shifted interference fringes from the first light and the second light. Therefore, the present invention can measure a wavefront of light propagating in a space.
본 발명의 일 실시 예에 따른 빛의 파면을 측정하기 위한 장치 및 이를 이용한 측정 방법 따르면 기하 위상 렌즈 기반의 간섭계와 편광 카메라를 이용하여 빛이 공간상에 전파해 나가는 형태인 파면을 측정할 수 있게 된다.</description><subject>COLORIMETRY</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDAOdwxzdQvy9wtR8HV1DA4N8vRzV3BxDfN0dnX0cwGKhXj4uyiEBoOEQzxcFYIdfV15GFjTEnOKU3mhNDeDsptriLOHbmpBfnxqcUFicmpeakm8d5CRgZGRgYGlkZGJhaMxcaoAPr8n7A</recordid><startdate>20220701</startdate><enddate>20220701</enddate><creator>JEONG HYO BIN</creator><creator>JOO KI NAM</creator><creator>PARK HYO MI</creator><scope>EVB</scope></search><sort><creationdate>20220701</creationdate><title>WAVEFRONT MEASURING DEVICEAND METHOD USING THE SAME</title><author>JEONG HYO BIN ; JOO KI NAM ; PARK HYO MI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR20220092248A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2022</creationdate><topic>COLORIMETRY</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>JEONG HYO BIN</creatorcontrib><creatorcontrib>JOO KI NAM</creatorcontrib><creatorcontrib>PARK HYO MI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>JEONG HYO BIN</au><au>JOO KI NAM</au><au>PARK HYO MI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>WAVEFRONT MEASURING DEVICEAND METHOD USING THE SAME</title><date>2022-07-01</date><risdate>2022</risdate><abstract>The present invention relates to a device for measuring a wavefront and a measuring method using the same. The device comprises: a light providing unit including a light source; a light splitter that reflects light from the light providing unit to a specimen and transmits the reflected light; a geometric phase lens module which separates the light transmitted through the light splitter into first light and second light having different sizes and wavefronts; and an optical detecting unit for obtaining four phase-shifted interference fringes from the first light and the second light. Therefore, the present invention can measure a wavefront of light propagating in a space.
본 발명의 일 실시 예에 따른 빛의 파면을 측정하기 위한 장치 및 이를 이용한 측정 방법 따르면 기하 위상 렌즈 기반의 간섭계와 편광 카메라를 이용하여 빛이 공간상에 전파해 나가는 형태인 파면을 측정할 수 있게 된다.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | COLORIMETRY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING |
| title | WAVEFRONT MEASURING DEVICEAND METHOD USING THE SAME |
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