WAVEFRONT MEASURING DEVICEAND METHOD USING THE SAME

The present invention relates to a device for measuring a wavefront and a measuring method using the same. The device comprises: a light providing unit including a light source; a light splitter that reflects light from the light providing unit to a specimen and transmits the reflected light; a geom...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	JEONG HYO BIN, JOO KI NAM, PARK HYO MI
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	COLORIMETRY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING
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Beschreibung
Zusammenfassung:	The present invention relates to a device for measuring a wavefront and a measuring method using the same. The device comprises: a light providing unit including a light source; a light splitter that reflects light from the light providing unit to a specimen and transmits the reflected light; a geometric phase lens module which separates the light transmitted through the light splitter into first light and second light having different sizes and wavefronts; and an optical detecting unit for obtaining four phase-shifted interference fringes from the first light and the second light. Therefore, the present invention can measure a wavefront of light propagating in a space. 본 발명의 일 실시 예에 따른 빛의 파면을 측정하기 위한 장치 및 이를 이용한 측정 방법 따르면 기하 위상 렌즈 기반의 간섭계와 편광 카메라를 이용하여 빛이 공간상에 전파해 나가는 형태인 파면을 측정할 수 있게 된다.