horizontal type terahertz spot beam optics device

The present invention relates to a horizontal terahertz spot beam optical apparatus, and more specifically, to the horizontal terahertz spot beam optical apparatus for improving inspection quality from an upper end to a lower end of an inspection target of a prescribed vertical shape. In addition, t...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	SHIN MOON SIK
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	COLORIMETRY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!