horizontal type terahertz spot beam optics device
The present invention relates to a horizontal terahertz spot beam optical apparatus, and more specifically, to the horizontal terahertz spot beam optical apparatus for improving inspection quality from an upper end to a lower end of an inspection target of a prescribed vertical shape. In addition, t...
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| creator | SHIN MOON SIK |
| description | The present invention relates to a horizontal terahertz spot beam optical apparatus, and more specifically, to the horizontal terahertz spot beam optical apparatus for improving inspection quality from an upper end to a lower end of an inspection target of a prescribed vertical shape. In addition, the horizontal terahertz spot beam optical apparatus comprises: a beam generation unit for radiating a terahertz wave beam; a reception unit which detects the terahertz wave beam that is radiated from the beam generation unit and horizontally penetrates the inspection target; a first lens unit which condenses the terahertz wave radiated from the beam generation unit into a spot form; and a second lens unit which condenses the terahertz wave into a spot form toward the reception unit to increase permeability.
본 발명은 수평형 테라헤르츠 스팟빔 광학장치에 관한 것으로, 보다 상세하게는 소정의 형상으로 수직한 형태의 피 검사체의 상단부터 하단까지 검사 품질을 향상시키기 위한 수평형 테라헤르츠 스팟빔 광학장치에 관한 것이다. 또한, 테라헤르츠파 빔을 조사하기 위한 빔 발생부와 상기 빔 발생부를 통해 조사되어 피 검사체를 수평하게 투과한 테라헤르츠파 빔을 검출하는 수신부와 상기 빔 발생부를 통해 조사되는 테라헤르츠파를 집속시켜 스팟형태로 집광시키는 제1 렌즈부와 수신부를 향해 테라헤르츠파를 스팟형태로 집광시켜 투과력을 높여주기 위한 제2 렌즈부를 포함하는 것을 특징으로 한다. |
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본 발명은 수평형 테라헤르츠 스팟빔 광학장치에 관한 것으로, 보다 상세하게는 소정의 형상으로 수직한 형태의 피 검사체의 상단부터 하단까지 검사 품질을 향상시키기 위한 수평형 테라헤르츠 스팟빔 광학장치에 관한 것이다. 또한, 테라헤르츠파 빔을 조사하기 위한 빔 발생부와 상기 빔 발생부를 통해 조사되어 피 검사체를 수평하게 투과한 테라헤르츠파 빔을 검출하는 수신부와 상기 빔 발생부를 통해 조사되는 테라헤르츠파를 집속시켜 스팟형태로 집광시키는 제1 렌즈부와 수신부를 향해 테라헤르츠파를 스팟형태로 집광시켜 투과력을 높여주기 위한 제2 렌즈부를 포함하는 것을 특징으로 한다.</description><language>eng ; kor</language><subject>COLORIMETRY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; PHYSICS ; RADIATION PYROMETRY ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220525&DB=EPODOC&CC=KR&NR=20220068065A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220525&DB=EPODOC&CC=KR&NR=20220068065A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SHIN MOON SIK</creatorcontrib><title>horizontal type terahertz spot beam optics device</title><description>The present invention relates to a horizontal terahertz spot beam optical apparatus, and more specifically, to the horizontal terahertz spot beam optical apparatus for improving inspection quality from an upper end to a lower end of an inspection target of a prescribed vertical shape. In addition, the horizontal terahertz spot beam optical apparatus comprises: a beam generation unit for radiating a terahertz wave beam; a reception unit which detects the terahertz wave beam that is radiated from the beam generation unit and horizontally penetrates the inspection target; a first lens unit which condenses the terahertz wave radiated from the beam generation unit into a spot form; and a second lens unit which condenses the terahertz wave into a spot form toward the reception unit to increase permeability.
본 발명은 수평형 테라헤르츠 스팟빔 광학장치에 관한 것으로, 보다 상세하게는 소정의 형상으로 수직한 형태의 피 검사체의 상단부터 하단까지 검사 품질을 향상시키기 위한 수평형 테라헤르츠 스팟빔 광학장치에 관한 것이다. 또한, 테라헤르츠파 빔을 조사하기 위한 빔 발생부와 상기 빔 발생부를 통해 조사되어 피 검사체를 수평하게 투과한 테라헤르츠파 빔을 검출하는 수신부와 상기 빔 발생부를 통해 조사되는 테라헤르츠파를 집속시켜 스팟형태로 집광시키는 제1 렌즈부와 수신부를 향해 테라헤르츠파를 스팟형태로 집광시켜 투과력을 높여주기 위한 제2 렌즈부를 포함하는 것을 특징으로 한다.</description><subject>COLORIMETRY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDDMyC_KrMrPK0nMUSipLEhVKEktSsxILSqpUiguyC9RSEpNzFXILyjJTC5WSEkty0xO5WFgTUvMKU7lhdLcDMpuriHOHrqpBfnxqcUFicmpeakl8d5BRgZGRgYGZhYGZqaOxsSpAgB9syz0</recordid><startdate>20220525</startdate><enddate>20220525</enddate><creator>SHIN MOON SIK</creator><scope>EVB</scope></search><sort><creationdate>20220525</creationdate><title>horizontal type terahertz spot beam optics device</title><author>SHIN MOON SIK</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR20220068065A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2022</creationdate><topic>COLORIMETRY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SHIN MOON SIK</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SHIN MOON SIK</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>horizontal type terahertz spot beam optics device</title><date>2022-05-25</date><risdate>2022</risdate><abstract>The present invention relates to a horizontal terahertz spot beam optical apparatus, and more specifically, to the horizontal terahertz spot beam optical apparatus for improving inspection quality from an upper end to a lower end of an inspection target of a prescribed vertical shape. In addition, the horizontal terahertz spot beam optical apparatus comprises: a beam generation unit for radiating a terahertz wave beam; a reception unit which detects the terahertz wave beam that is radiated from the beam generation unit and horizontally penetrates the inspection target; a first lens unit which condenses the terahertz wave radiated from the beam generation unit into a spot form; and a second lens unit which condenses the terahertz wave into a spot form toward the reception unit to increase permeability.
본 발명은 수평형 테라헤르츠 스팟빔 광학장치에 관한 것으로, 보다 상세하게는 소정의 형상으로 수직한 형태의 피 검사체의 상단부터 하단까지 검사 품질을 향상시키기 위한 수평형 테라헤르츠 스팟빔 광학장치에 관한 것이다. 또한, 테라헤르츠파 빔을 조사하기 위한 빔 발생부와 상기 빔 발생부를 통해 조사되어 피 검사체를 수평하게 투과한 테라헤르츠파 빔을 검출하는 수신부와 상기 빔 발생부를 통해 조사되는 테라헤르츠파를 집속시켜 스팟형태로 집광시키는 제1 렌즈부와 수신부를 향해 테라헤르츠파를 스팟형태로 집광시켜 투과력을 높여주기 위한 제2 렌즈부를 포함하는 것을 특징으로 한다.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | COLORIMETRY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING |
| title | horizontal type terahertz spot beam optics device |
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