3 CALIBRATION METHOD FOR STRUCTURED LIGHT 3D SCANNING AND SYSTEM THEREOF

The present invention relates to a calibration method and system for three-dimensional scanning of structured light. The method is the calibration method for three-dimensional scanning of structured light, which is performed by a system for three-dimensional scanning of structured light including a...

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Bibliographische Detailangaben
Hauptverfasser: LEE, HEE KONG, HWA, SUNG HYE
Format: Patent
Sprache:eng ; kor
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Beschreibung
Zusammenfassung:The present invention relates to a calibration method and system for three-dimensional scanning of structured light. The method is the calibration method for three-dimensional scanning of structured light, which is performed by a system for three-dimensional scanning of structured light including a projector, a camera, and a calibration unit, comprising steps of: (a) projecting a fringe pattern on an object by the projector; (b) photographing, by the camera, the object on which the fringe pattern is projected; and (c) performing calibration by the calibration unit measuring a phase change of the object through a conversion function and converting the same into three-dimensional coordinates (x, y, z). 본 발명은 구조광 3차원 스캐닝을 위한 캘리브레이션 방법 및 그 시스템에 관한 것이다. 상기 방법은, 프로젝터, 카메라, 캘리브레이션부를 포함하는 구조광 3차원 스캐닝을 위한 시스템에 의해 수행되는 구조광 3차원 스캐닝을 위한 캘리브레이션 방법으로서, (a) 상기 프로젝터가 객체에 프린지 무늬를 투사하는 단계; (b) 상기 카메라가 프린지 무늬가 투사된 객체를 촬영하는 단계; 및 (c) 상기 캘리브레이션부가 변환 함수를 통해 객체의 위상 변화를 측정하고 이를 3차원 좌표(x, y, z)로 변환하여 캘리브레이션을 수행하는 단계를 포함할 수 있다.