INTEGRATED CIRCUIT DEVICE AND SEMICONDUCTOR PACKAGE INCLUDING THE SAME
An object of the present invention is to provide an integrated circuit device comprising a through-silicon-via (TSV) structure and a semiconductor package comprising the same. The technical idea of the present invention comprises: a semiconductor substrate; a first TSV structures passing through a f...
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creator | JO CHA JEA KIM NAM HOON KWON OH GUK YEON SEUNG HOON KIM HYO EUN |
description | An object of the present invention is to provide an integrated circuit device comprising a through-silicon-via (TSV) structure and a semiconductor package comprising the same. The technical idea of the present invention comprises: a semiconductor substrate; a first TSV structures passing through a first region of the semiconductor substrate and spaced apart from each other at a first pitch; a first discrete element disposed between the first TSV structures and spaced apart from the first TSV structures by a distance greater than a first keep-off distance; and second TSV structures passing through a second region of the semiconductor substrate and spaced apart from each other by a second pitch smaller than the first pitch. An integrated circuit device in which an individual device of the same type as a first individual device is not disposed between the second TSV structures is provided.
본 개시의 기술적 사상은 반도체 기판; 상기 반도체 기판의 제1 영역을 관통하고, 제1 피치로 상호 이격된 제1 TSV(through-silicon-via) 구조들; 상기 제1 TSV 구조들 사이에 배치되고, 상기 제1 TSV 구조들로부터 제1 킵-오프 거리보다 큰 거리로 이격된 제1 개별 소자; 및 상기 반도체 기판의 제2 영역을 관통하고, 상기 제1 피치보다 작은 제2 피치로 이격된 제2 TSV 구조들;을 포함하고, 상기 제2 TSV 구조들 사이에는 상기 제1 개별 소자와 동종의 개별 소자가 배치되지 않는 집적회로 소자를 제공한다. |
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본 개시의 기술적 사상은 반도체 기판; 상기 반도체 기판의 제1 영역을 관통하고, 제1 피치로 상호 이격된 제1 TSV(through-silicon-via) 구조들; 상기 제1 TSV 구조들 사이에 배치되고, 상기 제1 TSV 구조들로부터 제1 킵-오프 거리보다 큰 거리로 이격된 제1 개별 소자; 및 상기 반도체 기판의 제2 영역을 관통하고, 상기 제1 피치보다 작은 제2 피치로 이격된 제2 TSV 구조들;을 포함하고, 상기 제2 TSV 구조들 사이에는 상기 제1 개별 소자와 동종의 개별 소자가 배치되지 않는 집적회로 소자를 제공한다.</description><language>eng ; kor</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220106&DB=EPODOC&CC=KR&NR=20220001956A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220106&DB=EPODOC&CC=KR&NR=20220001956A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>JO CHA JEA</creatorcontrib><creatorcontrib>KIM NAM HOON</creatorcontrib><creatorcontrib>KWON OH GUK</creatorcontrib><creatorcontrib>YEON SEUNG HOON</creatorcontrib><creatorcontrib>KIM HYO EUN</creatorcontrib><title>INTEGRATED CIRCUIT DEVICE AND SEMICONDUCTOR PACKAGE INCLUDING THE SAME</title><description>An object of the present invention is to provide an integrated circuit device comprising a through-silicon-via (TSV) structure and a semiconductor package comprising the same. The technical idea of the present invention comprises: a semiconductor substrate; a first TSV structures passing through a first region of the semiconductor substrate and spaced apart from each other at a first pitch; a first discrete element disposed between the first TSV structures and spaced apart from the first TSV structures by a distance greater than a first keep-off distance; and second TSV structures passing through a second region of the semiconductor substrate and spaced apart from each other by a second pitch smaller than the first pitch. An integrated circuit device in which an individual device of the same type as a first individual device is not disposed between the second TSV structures is provided.
본 개시의 기술적 사상은 반도체 기판; 상기 반도체 기판의 제1 영역을 관통하고, 제1 피치로 상호 이격된 제1 TSV(through-silicon-via) 구조들; 상기 제1 TSV 구조들 사이에 배치되고, 상기 제1 TSV 구조들로부터 제1 킵-오프 거리보다 큰 거리로 이격된 제1 개별 소자; 및 상기 반도체 기판의 제2 영역을 관통하고, 상기 제1 피치보다 작은 제2 피치로 이격된 제2 TSV 구조들;을 포함하고, 상기 제2 TSV 구조들 사이에는 상기 제1 개별 소자와 동종의 개별 소자가 배치되지 않는 집적회로 소자를 제공한다.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyrEKwjAQANAsDqL-w4GzECMKjsflmh61qaQX11IkTqKF-v-4-AFOb3lLU0lUDgmVPZAkyqLg-SbEgNFDz61QF30m7RJckRoMDBLpkr3EAFoz9Njy2iwe43Mum58rs61Yqd6V6T2UeRrv5VU-Q5Ocdc5auz8fT3j4b30BSOQs6w</recordid><startdate>20220106</startdate><enddate>20220106</enddate><creator>JO CHA JEA</creator><creator>KIM NAM HOON</creator><creator>KWON OH GUK</creator><creator>YEON SEUNG HOON</creator><creator>KIM HYO EUN</creator><scope>EVB</scope></search><sort><creationdate>20220106</creationdate><title>INTEGRATED CIRCUIT DEVICE AND SEMICONDUCTOR PACKAGE INCLUDING THE SAME</title><author>JO CHA JEA ; KIM NAM HOON ; KWON OH GUK ; YEON SEUNG HOON ; KIM HYO EUN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_KR20220001956A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; kor</language><creationdate>2022</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>JO CHA JEA</creatorcontrib><creatorcontrib>KIM NAM HOON</creatorcontrib><creatorcontrib>KWON OH GUK</creatorcontrib><creatorcontrib>YEON SEUNG HOON</creatorcontrib><creatorcontrib>KIM HYO EUN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>JO CHA JEA</au><au>KIM NAM HOON</au><au>KWON OH GUK</au><au>YEON SEUNG HOON</au><au>KIM HYO EUN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>INTEGRATED CIRCUIT DEVICE AND SEMICONDUCTOR PACKAGE INCLUDING THE SAME</title><date>2022-01-06</date><risdate>2022</risdate><abstract>An object of the present invention is to provide an integrated circuit device comprising a through-silicon-via (TSV) structure and a semiconductor package comprising the same. The technical idea of the present invention comprises: a semiconductor substrate; a first TSV structures passing through a first region of the semiconductor substrate and spaced apart from each other at a first pitch; a first discrete element disposed between the first TSV structures and spaced apart from the first TSV structures by a distance greater than a first keep-off distance; and second TSV structures passing through a second region of the semiconductor substrate and spaced apart from each other by a second pitch smaller than the first pitch. An integrated circuit device in which an individual device of the same type as a first individual device is not disposed between the second TSV structures is provided.
본 개시의 기술적 사상은 반도체 기판; 상기 반도체 기판의 제1 영역을 관통하고, 제1 피치로 상호 이격된 제1 TSV(through-silicon-via) 구조들; 상기 제1 TSV 구조들 사이에 배치되고, 상기 제1 TSV 구조들로부터 제1 킵-오프 거리보다 큰 거리로 이격된 제1 개별 소자; 및 상기 반도체 기판의 제2 영역을 관통하고, 상기 제1 피치보다 작은 제2 피치로 이격된 제2 TSV 구조들;을 포함하고, 상기 제2 TSV 구조들 사이에는 상기 제1 개별 소자와 동종의 개별 소자가 배치되지 않는 집적회로 소자를 제공한다.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES |
title | INTEGRATED CIRCUIT DEVICE AND SEMICONDUCTOR PACKAGE INCLUDING THE SAME |
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