INSPECTION DEVICE AND INSPECTION METHOD USING THE SAME

One embodiment of the present invention discloses an inspection device and an inspection method using the same. The inspection device comprises: a settlement unit with an opening at which a rear surface of a display device including a GIP circuit and a circuit board is exposed; a probe electrically...

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Bibliographische Detailangaben
Hauptverfasser:	YUN YONG WOO, PARK JUNG HEE
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	ADVERTISING ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICESUSING STATIC MEANS TO PRESENT VARIABLE INFORMATION CRYPTOGRAPHY DISPLAY EDUCATION MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEALS TESTING
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Beschreibung
Zusammenfassung:	One embodiment of the present invention discloses an inspection device and an inspection method using the same. The inspection device comprises: a settlement unit with an opening at which a rear surface of a display device including a GIP circuit and a circuit board is exposed; a probe electrically connected to an electric pad of the circuit board exposed at the opening; a driving unit electrically connecting the probe to the electric pad of the circuit board; a power source unit supplying a power source to the electric pad of the circuit board through the probe; and an inspection unit inspecting a defective transistor among a plurality of transistors disposed in the GIP circuit connected to the electric pad of the circuit board. 실시예는 GIP 회로와 회로기판을 포함하는 표시장치의 후면이 노출되는 개구부가 형성된 안착부; 상기 개구부로 노출된 상기 회로기판의 전극패드와 전기적으로 연결되는 프로브; 상기 프로브를 상기 회로기판의 전극패드와 전기적으로 연결시키는 구동부; 상기 프로브를 통해 상기 회로기판의 전극패드에 전원을 인가하는 전원부; 및 상기 회로기판의 전극패드와 연결된 GIP 회로 내에 배치된 복수 개의 트랜지스터 중 불량인 트랜지스터를 검출하는 검출부를 포함하는 검사 장치 및 이를 이용한 검사 방법을 개시한다.