BUILT-IN SELF-TEST FOR LIGHT EMITTING DIODES

In one part of an embodiment, a device comprises a built-in self-test to detect a defect between a first light emitting diode (LED) and a second LED. The device comprises a first pair of pads configured to couple to the first LED and a second pair of pads configured to couple to the second LED. The...

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Bibliographische Detailangaben
Hauptverfasser:	CHIODO ROSARIO, DE CICCO ADOLFO
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	ADVERTISING ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICESUSING STATIC MEANS TO PRESENT VARIABLE INFORMATION CRYPTOGRAPHY DISPLAY EDUCATION ELECTRIC HEATING ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY PHYSICS SEALS
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Beschreibung
Zusammenfassung:	In one part of an embodiment, a device comprises a built-in self-test to detect a defect between a first light emitting diode (LED) and a second LED. The device comprises a first pair of pads configured to couple to the first LED and a second pair of pads configured to couple to the second LED. The built-in self-test is configured to control a first driver and a second driver to turn-on each pass switch connected to the first and second pair of pads one-by-one. The built-in self-test is configured to determine a first forward voltage and a second forward voltage at both ends of the first LED and the second LED. The built-in self-test can determine whether or not there is a defect between the first LED and the second LED based on the forward voltage. 일부 예에서, 장치는 제1 발광 다이오드(LED)와 제 2 LED 사이의 결함을 검출하기 위한 내장형 자가 테스트를 포함한다. 이 장치는 제1 LED에 연결하도록 구성된 제1 패드 쌍과 제2 LED에 연결하도록 구성된 제2 패드 쌍을 포함한다. 내장 형 자가 테스트는 제1 및 제2 패드 쌍에 연결된 각각의 패스 스위치를 하나씩 턴온하도록 제1 드라이버 및 제2 드라이버를 제어하도록 구성된다. 내장형 자가 테스트는 제1 LED 및 제2 LED 양단의 제1 순방향 전압 및 제2 순방향 전압을 결정하도록 구성된다. 내장형 자체 테스트는 순방향 전압에 기초하여 제1 LED와 제2 LED 사이에 결함이 있는지 여부를 확인할 수 있다.