BUILT-IN SELF-TEST FOR LIGHT EMITTING DIODES

In one part of an embodiment, a device comprises a built-in self-test to detect if there is a defect on a light emitting diode (LED) or a driver for the LED. The device comprises a pair of pads configured to connect to the LED. The built-in self-test is configured to control the driver to turn-on ea...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	CHIODO ROSARIO, DE CICCO ADOLFO
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	ADVERTISING ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICESUSING STATIC MEANS TO PRESENT VARIABLE INFORMATION CRYPTOGRAPHY DISPLAY EDUCATION ELECTRIC HEATING ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY PHYSICS SEALS
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Beschreibung
Zusammenfassung:	In one part of an embodiment, a device comprises a built-in self-test to detect if there is a defect on a light emitting diode (LED) or a driver for the LED. The device comprises a pair of pads configured to connect to the LED. The built-in self-test is configured to control the driver to turn-on each pass switch connected to a pad of the pair of pads. The built-in self-test is then configured to determine a voltage level at each pad of the pair of pads. The built-in self-test can determine whether the defect exists on the LED, across a first anode pad and a first cathode pad, or on the driver based on the voltage level at each pad. 일부 예에서, 장치는 발광 다이오드(LED) 또는 LED용 드라이버 상에 결함이 있는지를 검출하는 내장형 자가 테스트를 포함한다. 장치는 LED에 연결하도록 구성된 패드 쌍을 포함한다. 내장형 자가 테스트는 패드 쌍의 패드에 연결된 각각의 패스 스위치를 턴온하도록 드라이버를 제어하도록 구성된다. 그런 다음 내장형 자가 테스트는 패드 쌍의 각 패드에서의 전압 레벨을 결정하도록 구성된다. 내장형 자가 테스트는 각 패드에서의 전압 레벨에 기초하여 LED 상에, 제1 애노드 패드 및 제1 캐소드 패드에 걸쳐, 또는 드라이버 상에 결함이 존재하는지를 결정할 수 있다.