ELECTRONIC DEVICE AND OPERATING METHOD OF ELECTRONIC DEVICE
Provided is a semiconductor memory which can improve operating characteristics and reliability of electronic devices. The semiconductor memory comprises: a first variable resistance film including antimony (Sb); a second variable resistance film containing antimony (Sb) in an amount different from t...
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Format: | Patent |
Sprache: | eng ; kor |
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Zusammenfassung: | Provided is a semiconductor memory which can improve operating characteristics and reliability of electronic devices. The semiconductor memory comprises: a first variable resistance film including antimony (Sb); a second variable resistance film containing antimony (Sb) in an amount different from that of the first variable resistance film, and having a crystallization rate different from that of the first variable resistance film; and a first electrode interposed between the first variable resistance film and the second variable resistance film.
반도체 메모리는, 안티몬(Sb)을 포함한 제1 가변 저항막; 상기 제1 가변 저항막과 상이한 함량으로 안티몬(Sb)을 포함하고, 상기 제1 가변 저항막과 결정화 속도가 상이한 제2 가변 저항막; 및 상기 제1 가변 저항막과 상기 제2 가변 저항막의 사이에 개재된 제1 전극을 포함할 수 있다. |
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