A Multi-Position Investigating Type of an X-ray Apparatus and a Method for Investigating a Product with the Same

The present invention relates to a multipoint examination type X-ray examination apparatus and a method thereof. The X-ray examination apparatus includes: a first guide pathway (12) connected to the outside of an examination room (R) to guide an article (A) to a first examination position; at least...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	YOUNG BOK GO, YEONG NAM KIM, HYEONG CHEOL KIM, YONG HAN JANG, TAE YUNLEE, JAE DONGLEE
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSIONOF CHEMICAL INTO ELECTRICAL ENERGY TESTING
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