ETCHING COMPOSITION FOR SILICON NITRIDE LAYER AND ETCHING PROCESS OF SILICON NITRIDE LAYER USING THE SAME

Disclosed are: a composition for etching a silicon nitride layer containing a phosphoric acid compound, water, and a predetermined first compound, a reaction product of the first compound, a predetermined second compound, a reaction product of the second compound, or a combination thereof; and an et...

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Bibliographische Detailangaben
Hauptverfasser: JANG JUN YOUNG, CHOI JUNG MIN, CHO YOUN JIN, MOON HYUNG RANG, HAN KWEN WOO, HWANG KI WOOK, KIM YUN JUN
Format: Patent
Sprache:eng ; kor
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Zusammenfassung:Disclosed are: a composition for etching a silicon nitride layer containing a phosphoric acid compound, water, and a predetermined first compound, a reaction product of the first compound, a predetermined second compound, a reaction product of the second compound, or a combination thereof; and an etching method performed by using the same. In the present invention, an etching selectivity for the silicon nitride layer is improved compared to a silicon oxide layer. 인산화합물; 물; 및 소정의 제1화합물, 상기 제1화합물의 반응 생성물, 소정의 제2화합물, 상기 제2화합물의 반응 생성물 또는 이들의 조합; 을 포함한 실리콘 질화막 식각용 조성물, 및 이를 이용하여 수행되는 식각 방법이 개시된다.