Etching composition and etching method using the same
The present invention relates to an etching composition and a method of etching a metal film using the same, and more specifically, to an etching composition for improving etching characteristics of a single metal layer or a multi metal layer, a method of etching a metal layer using the same, and a...
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Format: | Patent |
Sprache: | eng ; kor |
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Zusammenfassung: | The present invention relates to an etching composition and a method of etching a metal film using the same, and more specifically, to an etching composition for improving etching characteristics of a single metal layer or a multi metal layer, a method of etching a metal layer using the same, and a method of manufacturing a semiconductor device, including a process performed using the etching composition of the present invention. The etching composition includes: hydrogen peroxide; etching additives such as phosphoric acid compounds and sulfuric acid compounds; pH regulator; fluorine compounds; undercut inhibitors that are adenine, guanine, or mixtures thereof; amine compounds; and the remaining amount of water.
본 발명은 식각 조성물 및 이를 이용하는 금속막의 식각방법에 관한 것으로, 상세하게는 단일금속막 또는 다중금속막의 식각 특성을 향상시키는 식각 조성물, 이를 이용하는 금속막의 식각방법 및 본 발명의 식각 조성물을 이용하여 수행되는 공정을 포함하는 반도체 소자의 제조방법을 제공한다. |
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