Etching composition and etching method using the same

The present invention relates to an etching composition and a method of etching a metal film using the same, and more specifically, to an etching composition for improving etching characteristics of a single metal layer or a multi metal layer, a method of etching a metal layer using the same, and a...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: PARK JONG MO, LEE MYUNG HAN, KIM SE HOON, LEE YOUG JUN, CHI SANG WON, AHN HO WON
Format: Patent
Sprache:eng ; kor
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The present invention relates to an etching composition and a method of etching a metal film using the same, and more specifically, to an etching composition for improving etching characteristics of a single metal layer or a multi metal layer, a method of etching a metal layer using the same, and a method of manufacturing a semiconductor device, including a process performed using the etching composition of the present invention. The etching composition includes: hydrogen peroxide; etching additives such as phosphoric acid compounds and sulfuric acid compounds; pH regulator; fluorine compounds; undercut inhibitors that are adenine, guanine, or mixtures thereof; amine compounds; and the remaining amount of water. 본 발명은 식각 조성물 및 이를 이용하는 금속막의 식각방법에 관한 것으로, 상세하게는 단일금속막 또는 다중금속막의 식각 특성을 향상시키는 식각 조성물, 이를 이용하는 금속막의 식각방법 및 본 발명의 식각 조성물을 이용하여 수행되는 공정을 포함하는 반도체 소자의 제조방법을 제공한다.