APPARATUS AND METHOD FOR DETECTING DEFECT

Disclosed are an apparatus and a method for detecting a defect. The apparatus for detecting a defect according to one embodiment includes: a first region of interest extraction unit for extracting a region including the object into a first region of interest with respect to each of a plurality of im...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	JO SEONG HO, PARK DU WON, KIM KWANG JIN, JEON JOONG BAE
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	CALCULATING COMPUTING COUNTING HANDLING RECORD CARRIERS IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS PRESENTATION OF DATA RECOGNITION OF DATA RECORD CARRIERS
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