Manufacturing method of a semiconductor device and manufacturing apparatus used therein

According to the present invention, a manufacturing method of a semiconductor device comprises the steps of: forming a doped polysilicon layer on a substrate; forming a barrier layer on the doped polysilicon layer; forming an insertion layer on the barrier layer; plasma-processing a single layer of...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: LEE IN HEE, KIM EUN TAE, KIM SUK HOON, LEE HYE LAN, YOU NAM GIL, KONG MYUNG HO, HONG HYUNG SEOK, CHUNG KYUNG JAE
Format: Patent
Sprache:eng ; kor
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:According to the present invention, a manufacturing method of a semiconductor device comprises the steps of: forming a doped polysilicon layer on a substrate; forming a barrier layer on the doped polysilicon layer; forming an insertion layer on the barrier layer; plasma-processing a single layer of the insertion layer or a composite layer of the insertion layer and the barrier layer to form a base layer; and forming a metal layer on the base layer to complete a wiring layer. 본 발명의 반도체 소자의 제조 방법은 기판 상에 도핑된 폴리실리콘층을 형성하는 단계; 상기 도핑된 폴리실리콘층 상에 배리어층을 형성하는 단계; 상기 배리어층 상에 삽입층을 형성하는 단계; 상기 삽입층의 단일층이나 상기 삽입층 및 배리어층의 복합층을 플라즈마 처리하여 베이스층을 형성하는 단계; 및 상기 베이스층 상에 금속층을 형성하여 배선층을 완성하는 단계를 포함한다.