X-ray Inspection Apparatus Having Constitution of Stage Discharge

The present invention relates to an X-ray inspection device of a stage discharge structure and, specifically, to an X-ray inspection device of a stage discharge structure wherein a stage in which an inspection target is located has a structure capable of being moved to the outside and inside of an i...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: KI HUN SHIN, HYEONG CHEOL KIM, YONG HAN JANG, BONG JIN CHOI
Format: Patent
Sprache:eng ; kor
Schlagworte:
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