SIMIRALITY DETERMING APPARATUS OF SUBSYSTEM INDULDED IN A MODEL AND SIMIRALTIY DETERMINING METHOD FOR THE SAME

According to one embodiment of the present invention, provided is a method for measuring similarity of a subsystem in a model, which comprises the steps of: hierarchically classifying subsystems in a model; measuring similarity between the subsystems configured with functional blocks; and setting th...

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Bibliographische Detailangaben
Hauptverfasser:	KANG SEUNG HEON, OH SEUNG UK, CHOI KYUNG HWA, YEO JUN KI YEO, BAE HYUN SEOP
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS
Online-Zugang:	Volltext bestellen
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Beschreibung
Zusammenfassung:	According to one embodiment of the present invention, provided is a method for measuring similarity of a subsystem in a model, which comprises the steps of: hierarchically classifying subsystems in a model; measuring similarity between the subsystems configured with functional blocks; and setting the same subsystems as libraries as a result of the similarity measurement. 본 발명의 일 실시예에 따른 모델 내 서브시스템의 유사도 측정 방법은 모델 내 서브시스템들을 계층적으로 분류하는 단계, 기능블록으로 구성된 상기 서브시스템 간 유사도를 측정하는 단계 및 상기 유사도 측정 결과 상호 동일한 서브시스템들을 라이브러리로 설정하는 단계를 포함할 수 있다.