A sputtering target whose deposition rate is controlled and a method for manufacturing the same

The present invention relates to a sputtering target whose a deposition rate is controlled and a method for manufacturing the same. The present invention provides a sputtering target made of raw material powder consisting of a metal material selected from a metal group whose a particle structure is...

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Bibliographische Detailangaben
Hauptverfasser: PARK JOO HYEON, HONG GIL SOO, KWON OH JIB
Format: Patent
Sprache:eng ; kor
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Beschreibung
Zusammenfassung:The present invention relates to a sputtering target whose a deposition rate is controlled and a method for manufacturing the same. The present invention provides a sputtering target made of raw material powder consisting of a metal material selected from a metal group whose a particle structure is a body-centered cubic lattice, a face-centered cubic lattice, or a dense hexagonal lattice, wherein a surface fraction of a surface {001}, another surface {011}, and another surface {111} of a target material of the sputtering target is measured for a calculated velocity index to be 19.3% to 47.3%. 본 발명은 증착속도가 제어된 스퍼터링 타겟 및 이를 제조할 수 있는 방법과 관련된다. 본 발명은 실시예로, 입자 구조가 체심입방격자, 면심입방격자 또는 조밀육방격자인 금속군 중에서 선택되는 금속 소재로 이루어지는 원료 분말로 제조된 스퍼터링 타겟으로서, 상기 스퍼터링 타켓의 타켓물질의 {001}면, {011}면 및 {111}면의 면 분율을 측정하여 산출된 속도지수가 19.3% 내지 47.3%인 스퍼터링 타겟을 제시한다.