COATING PROCESSING APPARATUS AND COATING LIQUID COLLECTING MEMBER

The present invention provides a technology to collect and remove a coating solution scattered during a coating process, and prevent reduction of a throughput when the coating process is performed by rotating a substrate on which a high viscosity coating solution is supplied. In a resist coating app...

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1. Verfasser: UEMURA RYOICHI
Format: Patent
Sprache:eng ; kor
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Zusammenfassung:The present invention provides a technology to collect and remove a coating solution scattered during a coating process, and prevent reduction of a throughput when the coating process is performed by rotating a substrate on which a high viscosity coating solution is supplied. In a resist coating apparatus rotating a wafer (W) to coat a resist solution thereon, a coating solution collecting member (6) to collect a fiber-shaped coating solution generated by rotation of the wafer (W) is installed in an air discharge passage (25) installed in the circumferential direction of a cup body (2), and a solvent storing part (64) is installed in the coating solution collecting member (6). Such that, a solvent separated from the wafer (W) by centrifugal force when the solvent is supplied on the rear surface of the wafer (W) is dropped in the coating solution collecting member (6) to be stored in the solvent storage part (64). Moreover, the solvent is stored in the solvent storage part (64), such that the fiber-shaped coating solution (100) collected in the coating solution collecting member (6) is dissolved and removed during a resist coating process when the resist coating process is performed on the next wafer, thereby suppressing reduction of a throughput. 본 발명은, 고점도의 도포액을 공급한 기판을 회전시켜 도포 처리를 행하는 데 있어서, 도포 처리에 있어서 비산하는 도포액을 포집해서 제거함과 함께 스루풋의 저하를 억제하는 기술을 제공하는 것이다. 웨이퍼(W)를 회전시켜 레지스트액을 도포하는 레지스트 도포 장치에 있어서, 컵체(2)의 둘레 방향을 따라 설치한 배기로(25)에 웨이퍼(W)의 회전에 의해 발생하는 실 형상의 도포액을 포집하는 도포액 포집 부재(6)를 설치하고, 도포액 포집 부재(6)에 용제 저류부(64)를 설치하고 있다. 그 때문에 웨이퍼(W)에 이면측 용제 공급 처리를 행했을 때 웨이퍼(W)로부터 원심 탈액되는 용제가, 도포액 포집 부재(6)에 떨어져, 용제 저류부(64)에 저류된다. 그리고 용제 저류부(64)에 용제가 저류된 상태로 함으로써, 계속되는 웨이퍼(W)에 레지스트 도포 처리를 행했을 때 도포액 포집 부재(6)에 포집되는 실 형상의 도포액(100)을 레지스트 도포 처리 동안에도 용해 제거할 수 있어, 스루풋의 저하를 억제할 수 있다.