OPTICAL PROPERTY MEASURING DEVICE WITH MULTIPLE LIGHT SOURCE

According to one embodiment of the present invention, an optical property measuring apparatus with a multiple light source includes: a plurality of light sources generating different lights; a light source selection unit selecting a specific light source among the plurality of light sources so that...

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Bibliographische Detailangaben
Hauptverfasser:	RO, KYUNG WON, KANG, IN SUNG, KIM, HYUN NAM, JEONG, BYOUNG DO, BAEK, SEUNG MOO, CHOI, HUN, JOO, SUNG SIK, LEE, MYUNG SOO
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	According to one embodiment of the present invention, an optical property measuring apparatus with a multiple light source includes: a plurality of light sources generating different lights; a light source selection unit selecting a specific light source among the plurality of light sources so that the specific light among lights generated from the plurality of light sources is selected; a light irradiation unit irradiating the light of the light source selected by the light source selection unit to a sample; a light receiving unit collecting the light passing through the sample; a light analysis unit analyzing the light collected from the light receiving unit; and a light source selection control unit controlling a light source selection operation of the light source selection unit. 본 발명의 일실시예에 따른 다중 광원을 구비한 광특성 계측 장치는, 서로 다른 광을 생성하는 복수개의 광원; 복수개의 상기 광원으로부터 생성되는 광 중 특정 광이 선택되도록 하기 위하여 복수개의 광원 중 특정 광원을 선택하는 광원 선택부; 상기 광원 선택부에 의해 선택된 광원의 광을 시료에 조사하는 광조사부; 상기 시료를 통과하여 나오는 광을 수집하는 수광부; 상기 수광부에서 수집된 광을 분석하는 광분석부; 및 상기 광원 선택부의 광원 선택 작용을 제어하는 광원 선택 제어부;를 포함한다.