DEVICE AND METHOD FOR DETECTING DEFECT OF OPTICAL FILM

The present invention provides a device and a method for detecting a defect of an optical film to easily detect the defect present in the optical film. The device includes: a light irradiation unit for irradiating light; a reflection unit for reflecting the light emitted from the light irradiation u...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	YANG MYOUNG GON, KIM HO JIN, JANG EUNG JIN, CHOI HANG SUK
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	The present invention provides a device and a method for detecting a defect of an optical film to easily detect the defect present in the optical film. The device includes: a light irradiation unit for irradiating light; a reflection unit for reflecting the light emitted from the light irradiation unit to guide the light to an optical film; a screen for projecting a defect present in the optical film to display a projected shape when the light is projected on the optical film; and a photographing unit for photographing the projected shape displayed on the screen. 본 발명은 광학필름에 존재하는 결함을 용이하게 검출할 수 있는 광학필름 결함 검출 장치 및 광학필름 결함 검출 방법을 제공한다.