SEMICONDUCTOR DEVICE AND METHOD
Provided are a device in which a first opening is formed within a substrate, and a manufacturing process thereof. The first opening is reshaped into a second opening using a second etching process. The second etching process is performed through radical etching in which neutral ions are utilized. Ac...
Gespeichert in:
Hauptverfasser: | , , |
---|---|
Format: | Patent |
Sprache: | eng ; kor |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | Provided are a device in which a first opening is formed within a substrate, and a manufacturing process thereof. The first opening is reshaped into a second opening using a second etching process. The second etching process is performed through radical etching in which neutral ions are utilized. Accordingly, substrate push is reduced.
제1 개구부가 기판 내에 형성되어 있는 디바이스 및 그 제조 공정이 제공된다. 제1 개구부는 제2 에칭 공정을 이용하여 제2 개구부로 재성형된다. 제2 에칭 공정은 중성 이온을 사용하는 라디칼 에칭에 의해 수행된다. 이 경우, 기판 푸시(substrate push)가 감소한다. |
---|