ELECTRONIC INSTRUMENT CHARACTER TESTER

The present invention provides an electronic device character tester. The electronic device character tester includes: a connection part connected to a plurality of electronic devices to form independent channels; a measurement part for measuring the current and voltage of each of the plurality of e...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	LEE, MIN HYEOK, SONG, JUN SUNG, KIM, JUN SUNG, LEE, SUNG JAE, WON, DONG JO, HYUNG, JAE PIL, JEONG, UI HYO, KIM, SU KYOUNG, LIM, HONG WOO, LEE, YOUNG JOO, JANG, IN HYEOK
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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Beschreibung
Zusammenfassung:	The present invention provides an electronic device character tester. The electronic device character tester includes: a connection part connected to a plurality of electronic devices to form independent channels; a measurement part for measuring the current and voltage of each of the plurality of electronic devices through the channels; a calculation part for calculating electric power through the current and voltage of each of the plurality of electronic devices measured through the measurement part; and a control part for turning on and off the channels by using the measurement part and selectively controlling the current and voltage of each of the channels. It is possible to predict the lifetime of the device. 본 발명은 전자기기 특성 평가장치를 제공한다. 상기 전자기기 특성 평가장치는 다수의 전자 기기와 독립적인 채널들을 이루도록 접속되는 연결부와; 상기 채널들을 통해 상기 다수의 전자 기기 각각의 전류 및 전압을 측정하는 측정부와; 상기 측정부를 통해 측정되는 상기 다수의 전자 기기 각각의 전류 및 전압을 통해 전력을 산출하는 산출부; 및 상기 측정부를 사용하여, 상기 채널들을 온오프하여, 상기 다수의 전자 기기 각각의 전류 및 전압을 선택적으로 측정하도록 제어하는 제어부를 포함한다.