Probe Card for Image Element

According to an exemplary embodiment of the present invention, a probe card for an image element includes a first substrate which has a generally flat plate shape, a hole having a predetermined size and shape at a central part thereof, and a plurality of probes electrically connected to a lower surf...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	KIM, JUNG SU, JEONG, KI SEONG, BAEK, TAE JUN, OH, KYOUNG SEUNG
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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