Probe Card for Image Element
According to an exemplary embodiment of the present invention, a probe card for an image element includes a first substrate which has a generally flat plate shape, a hole having a predetermined size and shape at a central part thereof, and a plurality of probes electrically connected to a lower surf...
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| Format: | Patent |
| Sprache: | eng ; kor |
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| Zusammenfassung: | According to an exemplary embodiment of the present invention, a probe card for an image element includes a first substrate which has a generally flat plate shape, a hole having a predetermined size and shape at a central part thereof, and a plurality of probes electrically connected to a lower surface thereof, a fixing part which penetrates the hole of the first substrate from the upper surface to the lower surface, a light source part which is coupled to the inner periphery of the fixing part and includes a plurality of light sources where a light emitting diode is used as an individual light source, and a diffusing part which is provided on the light emitting surface side of the light source part. It is possible to provide a probe card using a light source which is semi-permanent and can be easily replaced.
본 기술의 일 실시예에 의한 이미지 소자를 위한 프로브 카드는 전체적으로 평판 형상이며, 중앙부에 기 설정된 크기 및 형태의 홀을 구비하고, 저면에 복수의 탐침이 전기적으로 접속되는 제 1 기판, 제 1 기판의 홀을 상면 측으로부터 저면 측으로 관통하도록 구성되는 고정부, 고정부 내주에 체결되며, 발광 다이오드를 개별 광원으로 하는 복수의 광원을 구비하는 광원부 및 광원부의 광 출사면 측에 마련되는 확산부를 포함하도록 구성될 수 있다. |
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