CIRCUIT FOR CALIBRATING INPUT/OUTPUT TERMINAL CHARACTERISTIC AND SEMICONDUCTOR APPARATUS INCLUDING THE SAME
The present technique includes a plurality of input/output terminals, wherein some of the input/output terminals are selectively receive a characteristic adjustment signal according to an external input to perform characteristic adjustment; and a characteristic adjustment signal generation circuit w...
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| Format: | Patent |
| Sprache: | eng ; kor |
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| Zusammenfassung: | The present technique includes a plurality of input/output terminals, wherein some of the input/output terminals are selectively receive a characteristic adjustment signal according to an external input to perform characteristic adjustment; and a characteristic adjustment signal generation circuit which is connected in common with the plurality of input/output terminals via a test signal line and commonly supplies the characteristic adjustment signal to the plurality of input/output terminals via the test signal line. It is possible to optimize the characteristics of the input/output terminals.
본 기술은 외부 입력에 따라 일부가 선택적으로 특성 조정 신호를 입력 받아 특성 조정이 이루어지도록 구성된 복수의 입/출력단; 및 테스트 신호 라인을 통해 상기 복수의 입/출력단과 공통 연결되며, 상기 테스트 신호 라인을 통해 상기 특성 조정 신호를 상기 복수의 입/출력단에 공통적으로 제공하도록 구성된 특성 조정신호 생성회로를 포함할 수 있다. |
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