STORAGE DEVICE TEST SYSTEM FOR TESTING THE SAME AND METHOD THEREOF

According to the present invention, a method of a test system includes: a step of issuing a command in a test program; a step of generating a plurality of commands corresponding to the command in a device driver; and a step of simultaneously transmitting the commands to a multi-port of each storage...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	WANG, KYU YEUL
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INFORMATION STORAGE PHYSICS STATIC STORES
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