PROBE CARD MODULE

The present invention discloses a probe card module which can achieve an electrical performance test required to upgrade an integrated circuit manufacturing technology with minimum costs. The probe card module comprises: a plurality of conductive probes; a printed circuit board having a non-circular...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	LEE TSUNG JUN, LAI HUNG WEI
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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