PROBE CARD

The present invention relates to a probe card. The probe card according to an embodiment of the present invention includes: a probe head having a plurality of probe needles being in contact with a wafer; a main printed circuit board which receives an external test signal, outputs an electric signal,...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	PARK, YOUNG GEUN, KIM, EUN YOUNG, HWANG, KYU HO, KIM, HYUN KU, JANG, KANG HO
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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