THICKNESS MEASURING MACHINE AND THAT SYSTEM
The present invention relates to a thickness measuring machine and a thickness measuring system using the same and, more specifically, relates to a thickness measuring machine and a thickness measuring system using the same which measures the thickness of an object using a pair of thickness measurin...
Gespeichert in:
Hauptverfasser: | , |
---|---|
Format: | Patent |
Sprache: | eng ; kor |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | The present invention relates to a thickness measuring machine and a thickness measuring system using the same and, more specifically, relates to a thickness measuring machine and a thickness measuring system using the same which measures the thickness of an object using a pair of thickness measuring machines formed to correspond to a shape of the object through replacement. The thickness measuring system comprises: first and second thickness measuring machines; a receiving part which stores the first and second thickness measuring machines therein; and an articulated robot which measures the thickness of the object using the first and second thickness measuring machines stored in the receiving part through replacement.
본 발명은 두께 측정 장치 및 이를 이용한 두께 측정 시스템에 관한 것으로서, 더욱 상세하게는 측정대상의 형상에 대응하여 구성된 한쌍의 두께 측정 장치를 교체 사용하여 측정 대상의 두께를 측정하는, 두께 측정 장치 및 이를 이용한 두께 측정 시스템에 관한 것이다. |
---|