METHOD FOR MEASURING LEAKAGE CURRENT OF THIN FILM TRANSISTOR

The objective of the present invention is to provide a method for measuring a leakage current of a thin film transistor capable of accurately measuring a low leakage current. To achieve the objective, the method comprises: a step of connecting one end of a capacitor to a source electrode of the thin...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	KIM, KI WOO, CHOI, YOON JI, KANG, JONG SEUK, LEE, KYUNG HO, BANG, HYUNG JIN, PARK, CHOONG KOO, SHIN, MIN HO
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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