TEST DEVICE AND TEST SYSTEM INCLUDING THE SAME

TEST DEVICE AND TEST SYSTEM INCLUDING THE SAME

Provided is a test device including a test unit and a voltage selecting unit. The test unit applies a test current to a test pad of a test target device to detect a test response voltage, and performs DC test on the test target device on the basis of the test response voltage. The voltage selecting...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: YOO, JONG WOON, HAN, SANG KYEONG, JANG, UNG JIN, SONG, KI JAE
Format: Patent
Sprache:eng ; kor
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:Provided is a test device including a test unit and a voltage selecting unit. The test unit applies a test current to a test pad of a test target device to detect a test response voltage, and performs DC test on the test target device on the basis of the test response voltage. The voltage selecting unit selects one of a plurality of voltages according to test modes, and applies the selected voltage to a ground voltage pad of the test target device. By selecting a voltage such that the test response voltage is not measured as a negative value, damage to the test target device during a testing process can be prevented.