ASSEMBLY FOR INTERFACING ELECTRIC SIGNAL AND

Disclosed are an assembly for interfacing an electric signal and an electric test device, capable of suppressing the delamination of a thin film resistor which is formed on one side of a substrate. The assembly for interfacing the electric signal includes a wiring line which interfaces the electric...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	KIM, YONG NAM, KIM, SANG DAN, CHO, WON JONG, OH, SUNG YOUNG, KIM, JI WON, LEE, DONG WON
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	Disclosed are an assembly for interfacing an electric signal and an electric test device, capable of suppressing the delamination of a thin film resistor which is formed on one side of a substrate. The assembly for interfacing the electric signal includes a wiring line which interfaces the electric signal between a tester which determines the electric state of an object and a probe which is electrically connected to the object when the electric state of the object is tested, a resistance line which is continuously connected to the wiring line as a part of the wiring line and provides resistance on an electric signal line which is interfaced between the probe and the tester, and a protection member which covers the boundary region of the resistance line and the surface of the substrate on which the resistance line is formed.