SYSTEM FOR TESTING INTEGRITY OF BURN-IN BOARDS FOR VARIOUS BURN-IN TESTS

An apparatus for testing a burn-in board according to the present invention comprises a function test unit and a DC test unit. When DUTs determined in advance as good products are mounted on all sockets of the burn-in board, the function test unit can generate a test pattern signal, apply the test pattern signal to the burn-in board, receive test result signals outputted from the DUTs through the sockets, compare the received test result signals with reference test result data, and determine a possibility of good-quality or bad-quality of a socket, a signal line, a circuit element, or a connector, which constitutes a signal transmission path on the burn-in board. When the possibility of the bad-quality is detected from the signal transmission path to which at least one socket belongs, the DC test unit can perform a DC test on the socket or all sockets of the burn-in board on the basis of terminal unit of each socket in such a state that the DUT is not mounted or a shorted-dummy DUT is mounted, and can identify the cause of the defect from the DC test result.