MOUNTING APPARATUS FOR INSPECTING OF SEMICONDUCTOR
The present invention relates to a camera mounting apparatus for inspecting a semiconductor. More specifically, the camera mounting apparatus according to the present invention comprises: a support member; a first shaft member which is fixed on the support member and elongated along an x-axis direct...
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Format: | Patent |
Sprache: | eng ; kor |
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Zusammenfassung: | The present invention relates to a camera mounting apparatus for inspecting a semiconductor. More specifically, the camera mounting apparatus according to the present invention comprises: a support member; a first shaft member which is fixed on the support member and elongated along an x-axis direction; a first member which rotates around the first shaft member; a second shaft member which is fixed on the first member and elongated along a y-axis direction; a second member which rotates and moves around the second shaft member; and a third member which is arranged on the second member and fixed to rotate around a central axis in a z-axis direction, wherein the third member includes a camera holding unit on which a camera for inspecting a semiconductor is fixed. According to the present invention, the camera, which is mounted, is sequentially rotated around central axes in x-axis, y-axis, and z-axis directions, such that an angle of the camera is finely and easily adjusted. |
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