MOUNTING APPARATUS FOR INSPECTING OF SEMICONDUCTOR

The present invention relates to a camera mounting apparatus for inspecting a semiconductor. More specifically, the camera mounting apparatus according to the present invention comprises: a support member; a first shaft member which is fixed on the support member and elongated along an x-axis direct...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: CHOI, HAK BUM
Format: Patent
Sprache:eng ; kor
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The present invention relates to a camera mounting apparatus for inspecting a semiconductor. More specifically, the camera mounting apparatus according to the present invention comprises: a support member; a first shaft member which is fixed on the support member and elongated along an x-axis direction; a first member which rotates around the first shaft member; a second shaft member which is fixed on the first member and elongated along a y-axis direction; a second member which rotates and moves around the second shaft member; and a third member which is arranged on the second member and fixed to rotate around a central axis in a z-axis direction, wherein the third member includes a camera holding unit on which a camera for inspecting a semiconductor is fixed. According to the present invention, the camera, which is mounted, is sequentially rotated around central axes in x-axis, y-axis, and z-axis directions, such that an angle of the camera is finely and easily adjusted.