SEMICONDUCTOR DEVICE ON DIB AND TEST SYSTEM

A semiconductor device, which is mounted on a device interface board, comprises: an AC test unit which tests an AC characteristic of the DUT; a DC test unit which provides a DC test path according to attributes of input and output terminals of the DUT; a first input and output interface unit which s...

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Bibliographische Detailangaben
Hauptverfasser:	HAN, SANG KYEONG, YOO, JONG WOON, JANG, UNG JIN
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY INFORMATION STORAGE MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES STATIC STORES TESTING
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Beschreibung
Zusammenfassung:	A semiconductor device, which is mounted on a device interface board, comprises: an AC test unit which tests an AC characteristic of the DUT; a DC test unit which provides a DC test path according to attributes of input and output terminals of the DUT; a first input and output interface unit which selectively connects the AC test unit or the DC test unit to ATE in response to a mode control signal; and a second input and output interface unit which selectively connects the AC test unit or the DC test unit to the DUT in response to the mode control signal. Therefore, the present invention may test an AC and a DC on the interface board.